Last edited by Kazrabar
Thursday, July 30, 2020 | History

7 edition of Fault-tolerance through reconfiguration of VLSI and WSI arrays found in the catalog.

Fault-tolerance through reconfiguration of VLSI and WSI arrays

by R. Negrini

  • 94 Want to read
  • 38 Currently reading

Published by MIT Press in Cambridge, Mass .
Written in English

    Subjects:
  • Integrated circuits -- Fault tolerance.,
  • Integrated circuits -- Very large scale integration.,
  • Integrated circuits -- Wafer-scale integration.

  • Edition Notes

    Other titlesFault tolerance through reconfiguration in VLSI and WSI arrays.
    StatementR. Negrini, M.G. Sami, R. Stefanelli.
    SeriesMIT Press series in computer systems
    ContributionsSami, Mariagiovanna., Stefanelli, Renato.
    Classifications
    LC ClassificationsQA76.9.F38 N44 1989
    The Physical Object
    Pagination301 p. :
    Number of Pages301
    ID Numbers
    Open LibraryOL2046130M
    ISBN 100262140446
    LC Control Number88023225

    The book draws on the author's Orion project at MCC, currently the most advanced object-oriented database system, and places this work in a larger context by using relational database systems and other object-oriented systems for comparison. Fault tolerance of electronic system is a major concern for the VLSI engineers. This can be realized from the post Need of Fault Tolerant VLSI System Design. The objective of this post is to introduce the proper tools for fault Read more →.

    Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays (Computer Systems Series) Stephen Neale: Descriptions '' John Napier: Rabdology (Charles Babbage Institute Reprint) Fritz Neumeyer: The artless word: Mies van der Rohe on the building art: fault tolerance. Section V explains about the various bio-inspired fault tolerant techniques used till date. Section VI discusses about the proposed method and finally, conclusions are drawn in Section VII. II. Importance Of VLSI Circuits Very Large Scale Integration [VLSI] is the process of creating an integrated circuit [IC] by combining.

    SUPPORT FOR FAULT TOLERANCE IN VLSI PROCESSORS† Marc Tremblay and Yuval Tamir Computer Science Department University of California, Los Angeles, California U.S.A. ABSTRACT Fault tolerance techniques are used to allow computer systems to continue correct operation despite component failure. Hardware-supported concurrent error-detection and. ,,and and fault tolerance FPGAs by shifting the on data. In on and ,editors,Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI Systems November Google Scholar; 4.


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Fault-tolerance through reconfiguration of VLSI and WSI arrays by R. Negrini Download PDF EPUB FB2

By means of dedicated arrays, they note, it is possible to build systems that are orders of magnitude more powerful than programmed computers. Their treatment of networks and arrays is extensive and has wide applicability. pages: 24 cm Cover title: Fault tolerance through reconfiguration in VLSI and WSI Pages: COVID Resources.

Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle coronavirus.

" Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays by R. Negrini; R. Stefanelli; M. Sami A copy that has been read, but remains in clean condition. All. This book brings together and discusses the most significant results scattered across the vast field of research in fault tolerance.

Fault tolerance is one of the principle mechanisms for achieving high reliability, high availability in digital systems. It is the survival attribute of digital systems.

This book brings together and discusses the most significant results scattered across the. In large VLSI/WSI arrays, improved reliability and yield can be obtained through reconfiguration techniques. In fault tolerance design, redundancy is used to offset faults when they occur in the arrays.

Since redundant components are themselves susceptible to faults, their number must be a minimum. Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays Roberto Negrini, Mariagiovanna Sami, and R. Stefanelli This book brings together and discusses the most significant results scattered across the vast field of research in fault tolerance.

Fault-tolerant VLSI processor array for the SVD. Fault Tolerance through Reconfiguration in VLSI and WSI Arrays. Book. Wafer-scale integration and two-level pipelined implementation of. This paper presents a heuristic approach to accelerate the reconfiguration of two-dimensional degradable VLSI arrays linked by 4-port switches in presence of faulty processing elements (PEs).

18 Malfunction Tolerance ~ System-level reconfiguration ~ Isolating a malfunctioning element ~ Data and state recovery ~ Regular arrays of modules ~ Low-redundancy sparing ~ Malfunction-tolerant scheduling.

As the density of VLSI and WSI arrays increases, probability of the occurrence of faults in the arrays during fabrication also increases. Since, such faults together with faults at run-time affect the reliability of the whole system, fault-tolerant technologies must be employed to enhance the reliability of VLSI/WSI Cited by:   F.

Distante, M.G. Sami and R. Stefanelli, “Harvesting through array partitioning: a solution to achieve defect tolerance Defect and Fault Tolerance in VLSI Systems”, Proc. IEEE International Symp.

Defect and Fault Tolerance in VLSI Systems, Paris, pp. –, Google ScholarCited by: 2. Abstract. This paper describes a novel technique to speed up the reconfiguration for the VLSI arrays. We propose an efficient algorithm based on A-star algorithm for accelerating reconfiguration of the power efficient VLSI processor subarrays to meet the real-time constraints and lower power consumption of the embedded by: 1.

A widely used interconnec- tion network is the two dimensional rectangular configuration figure (i). Arrays are manufac- tured using high density integration techniques such as Very Large Scale Integration (VLSI) and Wafer Scale Integration (WSI).

An important fea- ture in the VLSI/WSI implementation of array systems is fault tolerance, [5, 6].Author: L.

Jervis, D. Sciuto. Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

The goals of defect-tolerance and fault-tolerance are. "Orthogonal Mapping: A Reconfiguration Strategy for Fault Tolerant Two-Dimensional VLSI/WSI Arrays," in Defect and Fault Tolerance in VLSI Systems: I, Edited by I. Koren, pp.Plenum Press, New York, (with L. Jervis and D.

Sciuto). Abstract Shorter total interconnect and fewer switches in a processor array definitely lead to less capacitance, power dissipation and dynamic communication cost between the processing paper presents an algorithm to find a maximum logical array (MLA) that has shorter interconnect and fewer switches in a reconfigurable VLSI array with hard/soft by: 1.

– in VLSI yield can be 10% or less • External tests are used to detect and locate the faults off-line • Reconfiguration algorithms are used to find an interconnection pattern to create a functional array • The reconfiguration is usually irreversible p.

36 - Design of Fault Tolerant Systems - File Size: 98KB. Get this from a library. Defect and fault tolerance in VLSI systems: volume 2: proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October, in Tampa, Florida.

[C H Stapper; V K Jain; Gabrièle Saucier;]. You can write a book review and share your experiences. Other readers will always be interested in your opinion of the books you've read.

Whether you've loved the book or not, if you give your honest and detailed thoughts then people will find new books that are right for them. * * * * * * * * * Ciciani, B., Manufacturing Yield Evaluation of VLSI/WSI Systems, IEEE Computer Society Press, * Note that the product of defect density and.

J.M. Emmert, D. Bhatia. "Partial Reconfiguration of FPGA Mapped Designs with Applications to Fault Tolerance and Yield Enhancement". Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays. The MIT Press, Cambridge, MA, XC Field Programmable Gate Arrays Data Book.

December Fault Tolerance Through Reconfiguration in VLSI and WSI Arrays, (). Graph Theory with applications to Engineering and Computer Science.Note: If you're looking for a free download links of Defect and Fault Tolerance in VLSI Systems: Volume 2 (Defect & Fault Tolerance in VLSI Systems) Pdf, epub, docx and torrent then this site is not for you.

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